Overcome High-Speed I/O Verification Challenges with Stratix V On-Die Instrumentation
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چکیده
This document discusses verification and debug of high-speed I/O using the on-die instrumentation (ODI) features of the Altera 28-nm Stratix® V device. In line with Moore's law, I/O technology trends continue to double in speed and data rates every two to three years. As the speed and data rates of I/Os increase, new verification and test challenges emerge. This white paper describes the challenges of verifying highspeed links, and how Altera's 28-nm Stratix V ODI technology overcomes these challenges, and describes the ODI applications.
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تاریخ انتشار 2011